Trap-state mapping to model GaN transistors dynamic performance

Ka-Band GaN Large-Signal Model Considering Trap Effect on Nonlinear Capacitance by Using Transient S-Parameters Measurement

In Situ Measurement of Effective Gate Bias Voltage in Ionic Liquid-Gated Organic Field-Effect Transistors: Exploring Intrinsic Performance and Trap Density of States

Trap-state mapping to model GaN transistors dynamic performance

Investigation of Bulk Traps by Conductance Method in the Deep Depletion Region of the Al2O3/GaN MOS Device

Study of an Al2O3/GaN Interface for Normally Off MOS-Channel High-Electron-Mobility Transistors Using XPS Characterization: The Impact of Wet Surface Treatment on Threshold Voltage VTH

Trap-state mapping to model GaN transistors dynamic performance

3D NAND fash and FeFET in the data storage roadmap

Trap-state mapping to model GaN transistors dynamic performance

Surface nitridation for improved dielectric/III‐nitride interfaces in GaN MIS‐HEMTs - Chen - 2015 - physica status solidi (a) - Wiley Online Library